We provide the technical support of the SEM/EDS to the customers in both public and private sectors; university, institute, steel, electronics, semiconductor, harddisk, phamaceutical, mining, biology and any microanalysis application.

We are expert in the automate particle analysis by SEM/EDS. The application is in these areas:-

- Forensics; Gun Shot Residue

- Health Sciences; Pharmaceutical

- Industrial Automation; Oil Engine

- Metals; Steel

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Do you have a sample you'd like to send us to have scanned by our SEM? Contact us enquiry@absotecthailand.com

NEW PRODUCT 2011

OmegaMax™ – "See More, Faster"
The Power to Perceive becomes even stronger with the launch of OmegaMax™ -- an integrated, systems-based approach to SEM/EDX technology that takes performance, reliability and verification to the next level.

SENSITIVITY & RESOLUTION PERFORMANCE GAINS

5X IMPROVEMENT IN MEASUREMENT SPEED

The science behind OmegaMax is in its name. Omega (Ω) is the symbol for solid angle, and maximizing that angle is the most important measure of an optimized x-ray detection system. Putting the latest technology to work, OmegaMax increases the solid angle view – something that previously required a larger Silicon Drift Detector (SDD) detector, a closer SDD detector and a greater number of SDD detectors.

Find more information at OMEGAMAX

BENCHTOP SEM ANALYZER "PSEM eXpress"

New Benchtop SEM Analyzer Delivers More Features, More Samples, Less Cost
Starting at $75,000, the PSEM eXpress™ quickly accommodates real-world specimens with 80 mm x 100 mm stage travel, SDD-EDS capability, and a simple user interface. Comparable in size to a laser printer, it detects particles from 100 nm to 5 mm with 25 nm resolution. The instrument is cGMP compliant and can be used to address quality control issues in a variety of industries, including forensics, health sciences, industrial automation, and metals.

“The PSEM eXpress™ represents several new advancements in particle analysis,” said Greg Ott, CEO of ASPEX. “Not only does the PSEM eXpress™ offer standard SEM/EDS functionality at a smaller form and price point, it also has the largest chamber in its class. We are excited to provide these features in a system that offers the lowest cost of ownership industry-wide.”
Find more information at PSEM eXpress

Technical paper developed by ASPEX:-

Introduction to Automated Particle Analysis by Focused Electron Beam

This document is intended to provide a brief entry-level introduction to the concepts and technology employed in the automated particle analysis systems manufactured by ASPEX Corp. My objective is to convey a big-picture sense of what our instruments do, and roughly how they do it.

Basic Principles: Electroan Beam vs. Optical Imaging of Particles

The only realistic way to understand a population of particles is to measure a sufficiently large distribution of individuals relative to pertinent parameters such as size, shape, and composition. In nearly every case, the most reliable technique for obtaining such a distribution involves the direct imaging of particles such that their dimensional attributes can be accurately established.